Read e-book online A practical guide to transmission electron microscopy. PDF

By Zhiping Luo

ISBN-10: 1606509179

ISBN-13: 9781606509173

ISBN-10: 1606509187

ISBN-13: 9781606509180

Transmission electron microscope (TEM) is an important device for characterizing quite a few forms of fabrics. utilizing a mild microscope, the imaging solution is at a number of hundred nanometers, and for a scanning electron microscope, SEM, at numerous nanometers. The imaging answer of the TEM, in spite of the fact that, can in many instances succeed in a number of angstroms on a modem device. moreover, the TEM may also supply material Read more...

summary: Transmission electron microscope (TEM) is an important device for characterizing quite a few sorts of fabrics. utilizing a mild microscope, the imaging solution is at a number of hundred nanometers, and for a scanning electron microscope, SEM, at a number of nanometers. The imaging answer of the TEM, even if, can oftentimes achieve a number of angstroms on a modem software. moreover, the TEM may also supply fabric structural details, because the electrons penetrate in the course of the skinny specimens, and chemical compositional details a result of powerful electron-specimen atom interactions. these days, TEM is greatly utilized in varied parts in either actual sciences (chemistry, engineering, geosciences, fabrics technology, and physics) and existence sciences (agriculture, biology, and medicine), taking part in a key position in examine or improvement for fabric layout, synthesis, processing, or functionality. This publication offers a concise sensible consultant to the TEM consumer, ranging from the newbie point, together with upper-division undergraduates, graduates, researchers, and engineers, on the best way to research TEM successfully in a brief time period. it truly is written essentially for fabrics technology and engineering or comparable disciplines, whereas a few purposes in existence sciences also are integrated. It covers many of the components utilizing TEM, together with the instrumentation, pattern coaching, diffraction, imaging, analytical microscopy, and a few newly constructed complex microscopy options. In each one subject, a theoretical history is to start with in short defined, with step by step directions in experimental operation or computation. a few technical suggestions are given so as to receive the simplest effects. the sensible methods to procure, examine, and interpret the TEM info are as a result supplied. This publication might function a textbook for a TEM direction or workshop, or a reference booklet for the TEM consumer to enhance their TEM abilities

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Additional resources for A practical guide to transmission electron microscopy. Volume II, : Advanced microscopy

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29) 36 A PRACTICAL GUIDE TO TRANSMISSION ELECTRON MICROSCOPY Fig. 11 (a) Chromatic aberration envelope function Ec(u); (b) spatial coherence envelope function Es(u); (c) envelop function E ( u ) = E c ( u ) ⋅ E s ( u ) ; (d) contrast transfer function H(u). 74 nm. In the image plane, the wave function is obtained by the FT of Eq. 30) Here, the symbol ⊗ stands for a convolution operation. 31) where we ignore the σ 2 terms for the thin specimen. 32) IMAGING II 37 Fig. 12 (a) Structure model of FCC; (b) image under WPOA (a unit cell is outlined).

3. Imaging conditions, including zone axis [UVW], thickness t (a single thickness or a series of thicknesses), defocus (negative for underfocus as convention, but some program may define a position values for underfocus; a single defocus or a series of defocus values), objective lens aperture size ( Å −1 or nm −1 ) and center position (x, y) (in the units of h and k, respectively), crystal tilt, which is expressed as the center of the Laue circle (x, y) (in the units of h and k, respectively), beam tilt, which is expressed as the center of optical axis (x, y) (in the units of h and k, respectively), and mechanical vibration (in Å or nm).

68 Å −1 and its center position = (0, 0), center of Laue circle = (0, 0), center of optical axis = (0, 0), and mechanical vibration = 0 Å. A montage of simulated images is shown in Fig. 15(b) with variations of defocus Δf and thickness t. Unit cells are outlined, and each image contains 2 × 4 cells. According to Eq. 76 nm. When the sample is very thin (2 nm), the image appears as white spots under Δf = −20 nm; when it is close to the Scherzer defocus with Δf = −40 nm, the atomic positions appear as dark spots.

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A practical guide to transmission electron microscopy. Volume II, : Advanced microscopy by Zhiping Luo


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